OpTaliX-LT v10.50 [Latest]

OpTaliX-LT – is a comprehensive program for computer aided design of optical systems, thin film multilayer coatings and illumination systems.

OpTaliX provides powerful features to conceptualize, design, optimize, analyze, tolerance and document virtually any optical system.

OpTaliX includes geometrical and diffraction analysis, optimization, thin film multilayer analysis and refinement, non-sequential ray trace, physical optics propagation, polarization analysis, ghost imaging, tolerance analysis, extensive manufacturing support, user defined graphics, illumination, macros, and many more.

Features
• Sequential and non-sequential ray tracing
• Zoom and multi-configuration systems
• Thin-film multilayer analysis and refinement
• Advanced optimization algorithms with exact constraints handling
• Polarization Analysis
• Illumination Analysis
• Tolerance analysis (Tolerance on anything)
• Full geometrical and diffraction analysis
• Macro language with variables, loops, conditional constructs, user-defined functions, etc.
• Environmental analysis
• And much more..

What’s New
* Index of refraction plot for selected glasses added.
* Code V import and export: Support of Pickup surfaces and central aperture obscurations.
* Macro editor: The lens data items [ss], [so] and [si] were not recognized and
returned error messages.
* The tolerance sensitivities TSX, TSY, TSZ, TSA, TSB, TSG returned incorrect results
due to an internal parameter shift. Now corrected.
* TMAT (transformation matrix) is now correctly applied when the matrix is referred
to global coordinates.
* Wavefront plot vs. wavelength corrected. Previously the wavefront at only four
wavelength were drawn even if more wavelength are defined.
* SUMITA glass catalogue updated.

Title Release: OpTaliX.LT.v10.50
Developer: Home Page
License: ShareWare
OS: Windows
Download:
OpTaliX-LT v10.50 (35 MB)